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Research On Quality Inspection And Metrological Inspection Technology
ISBN:978-981-5189-88-9
Chief Editors: Song Chenglin; Jiang Yunkun; Zhang Ying
Associate Editors: Shi Huiping; Li Zhen; Qu Yang; Zhang Junchao; Guan Fangfang; Sha Long
Research On Quality Inspection And Metrological Inspection Technology; Chief Editors: Song Chenglin; Jiang Yunkun; Zhang Ying; ISBN: 978-981-5189-88-9